Scientific publications

Engineering 3D nanoplasmonic assemblies for high performance spectroscopic sensing

Authors : S. Dinda, V. Suresh, P. Thoniyot, A. Bal-ìytis, S. Juodkazis, and S. Krishnamoorthy

Reference : ACS Applied Materials & Interfaces, vol. 7, no. 50, pp. 27661-27666, 2015

Strain-induced deformation mechanisms of polylactide plasticized with acrylated poly(ethylene glycol) obtained by reactive extrusion

Authors : K. Wang, B. Brüster, F. Addiego, G. Kfoury, F. Hassouna, D. Ruch, J. M. Raquez, and P. Dubois

Reference : Polymer International, vol. 64, no. 11, pp. 1544-1554, 2015

Multiple bifurcations in wrinkling analysis of thin films on compliant substrates

Authors : F. Xu, M. Potier-Ferry, S. Belouettar, and H. Hu

Reference : International Journal of Non-Linear Mechanics, vol. 76, pp. 203-222, 2015

Thermo-anisotropic crack propagation by XFEM

Authors : L. Bouhala, A. Makradi, and S. Belouettar

Reference : International Journal of Mechanical Sciences, vol. 103, pp. 235-246, 2015

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Authors : test lun

Reference : test lun

Investigation of the depth-profiling capabilities of the Storing Matter technique

Authors : B. Kasel and T. Wirtz

Reference : Journal of Mass Spectrometry, vol. 50, no. 10, pp. 1144-1149, 2015

Unraveling the architecture of plasma polymers by electrospray tandem mass spectrometry

Authors : T. Fouquet

Reference : International Journal of Mass Spectrometry, vol. 389, pp. 1-9, 2015

High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

Authors : T. Wirtz, P. Philipp, J. N. Audinot, D. Dowsett, and S. Eswara

Reference : Nanotechnology, vol. 26, no. 43, art. no. 434001, 2015

Time-resolved small-angle X-ray scattering study of void fraction evolution in high-density polyethylene during stress unloading and strain recovery

Authors : F. Addiego, S. Patlazhan, K. Wang, S. André, S. Bernstorff, and D. Ruch

Reference : Polymer International, vol. 64, no. 11, pp. 1513-1521, 2015

Advanced SIMION techniques: Boundary matching and genetic optimization

Authors : D. Dowsett

Reference : Microscopy and Microanalysis, vol. 21, no. S4, pp. 218-223, 2015

Silver diffusion in organic optoelectronic devices: Deposition-related processes versus Secondary Ion Mass Spectrometry analysis artifacts

Authors : P. Philipp, K. Q. Ngo, J. Kieffer, and T. Wirtz

Reference : The Journal of Physical Chemistry C, vol. 119, no. 41, pp. 23334-23341, 2015

Significant enhancement of negative secondary ion yields by cluster ion bombardment combined with cesium flooding

Authors : P. Philipp, T. B. Angerer, S. Sämfors, P. Blenkinsopp, J. S. Fletcher, and T. Wirtz

Reference : Analytical Chemistry, Vol. 87, no. 19, pp. 10025–10032, 2015

Scientific publications

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