Helium diffraction on SiC grown graphene: Qualitative and quantitative descriptions with the hard-corrugated-wall model

Authors

M. Debiossac, A. Zugarramurdi, Z. Mu, P. Lunca-Popa, A. J. Mayne, and P. Roncin

Reference

Physical Review B, vol. 94, no. 20, 2016

Description

Monolayer epitaxial graphene grown on 6H-SiC(0001), was recently investigated by grazing incidence fast atom diffraction and analyzed with ab initio electronic density calculation and with exact atomic diffraction methods. With these results as a reference, the hard corrugated wall model (HCW) is used as a complementary analytic approach to link binary potentials to the observed atomic corrugation. The main result is that the HCW model reproduces the macroscopic corrugation of the Moir\'{e} pattern on a quantitative level suggesting that softwall corrections may be neglected for macroscopic superstructures allowing straightforward analysis in terms of a 1D corrugation function.

Link

https://journals.aps.org/prb/accepted/5f07fN24C9f10b17e23529788f858d1cdf9a76f41