Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System

Authors

De Castro O., Hoang H.Q., Bouton O., Barrahma R., Coulbary C., Wirtz T.

Reference

Microscopy and Microanalysis, vol. 30, n° 2024, pp. 631-632, 2024

Link

doi:10.1093/mam/ozae044.297

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