Materials Characterisation Day 2016

Materials Research and Technology is a cornerstone of Europe's innovation strategy. The European Commission (EC) considers that “70% of all new product-innovation is based on materials with new / improved properties.”  Within this context, a proper Characterisation of Materials is essential.

Objectifs

The objective of the Materials Characterisation Day is to present the large panel of capabilities available in the Materials Research and Technology Department (MRT) @ LIST. The day will specifically focus on the analytical techniques for Physical-Chemical characterisation, ranging from Secondary Ion Mass Spectrometry (SIMS) and molecular mass spectrometry, Photo-Electron Spectroscopy  (XPS, Auger) to Electron and Helium Ion Microscopy (SEM, HIM) and optical spectroscopy (Raman and IR), to name a few. Additional overview presentations will exemplify characterisation means outside the MRT platform, but available at the University of Luxembourg  or at Large Scale Instruments (synchrotron radiation and neutron sources).

Programme

8.30 - Welcome coffee

8.50 - Introduction

9.00 - Elemental and isotopic analysis by D-SIMS

Dr Nathalie Valle, Luxembourg Institute of Science and Technology

9.30 - Localisation, identification and separation of molecules

Dr Gilles Frache, Luxembourg Institute of Science and Technology

10.00 - Surface analysis by electron spectroscopies  (XPS-AES-UPS)

Dr Jérôme Guillot, Luxembourg Institute of Science and Technology

10.30 - Coffee-break

11.00 - XRD: Structural analysis at LIST

Dr Yves Fleming, Luxembourg Institute of Science and Technology

11.30 - Capabilities of Environmental Scanning Electron Microscopy

Jean-Luc Biagi, Luxembourg Institute of Science and Technology

12.00 - Lunch

13.00 - Lab visit

14.00 - Helium Ion Microscopy

Dr Tom Wirtz, , Luxembourg Institute of Science and Technology

14.30 - Raman spectroscopy and photoluminescence

Dr Mael Guennou, Luxembourg Institute of Science and Technology

15.00 - In-situ strain measurement

Dr Frédéric Addiego, Luxembourg Institute of Science and Technology

15.30 - Coffee-break

15.45 - Electronic structure characterisation: simulations and experiments at UL

Prof. Susanne Siebentritt, University of Luxembourg

16.30 - “Access to Large Scale Research Instruments for Luxembourg Researchers, Support from the National Contact Point”

Dr Inmaculada Peral Alonso, University of Luxembourg

17.00 - Aperitif and Networking

PUBLIC

The target audience are researchers from both public and industrial institutions in Luxembourg, going the whole range from PhD students to senior researchers and engineers.

Partager cette page :

Materials Characterisation Day 2016

Register now!

Informations pratiques

Date: October 14, 2016

Language: English

Duration: 1 day

Venue: Luxembourg Institute of Science and Technology (LIST), 41, rue du Brill, L-4422 Belvaux

Registration: Mandatory in the limit of available places.