Conference "Helium Ion Microscopy and Emerging Focused Ion Beam Technologies" (HEFIB 2016)

HEFIB 2016

We are pleased to announce the 1st International Conference on Helium Ion Microscopy and Emerging Focused Ion Beam Technologies (HEFIB 2016) which will be held from 8 to 10 June 2016 in Luxembourg City.

The purpose of the conference is to bring together the rapidly growing community active in the fields of Helium Ion Microscopy and other emerging Focused Ion Beam technologies in view of stimulating scientific and technical exchanges.

> Get more information on the conference website!

Topics

• Helium Ion Microscopy
• Emerging Focused Ion Beam technologies and novel ion sources
• Materials nano-modification and lithography
• Nano-imaging and nano-analytics, including correlative approaches
• Bio-imaging
• Fundamentals and modelling on particle-matter interactions
• Instrument development

Programme

The programme will include invited talks, contributed oral presentations, a poster session, and topical round table discussions. Several social events (including an excursion and a conference dinner) will provide room for networking.

The organizing committee

Tom Wirtz, Luxembourg Institute of Science and Technology, Luxembourg
Paul Alkemade, Delft University of Technology, The Netherlands
Armin Gölzhäuser, University of Bielefeld, Germany
Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Germany
Honghzhou Zhang, Trinity College Dublin, Ireland