A correlative methodology based on SIMS for advanced materials characterization

Auteurs

S. Eswara, R. Hu, L. Yedra, J.-N. Audinot, A. Schwedt, C. Tasan, J. Mayer, D. Raabe, and T. Wirtz

Référence

in 16th European Microscopy Congress 2016, August 28 - September 2, 2016, Lyon, France, 2016

Lien

doi:10.1002/9783527808465.EMC2016.6003