Parallel ion electron spectrometry (PIES): A new paradigm for high-resolution high-sensitivity characterization based on integrated TEM-SIMS
Auteurs
S. Eswara Moorthy, D. Dowsett, L. Yedra, and T. Wirtz
Référence
Microscopy and Microanalysis, vol. 21, no. S3, pp. 1859-1860, Aug.2015
