Towards a high-brightness electron impact ion source for nano-applications
Auteurs
O. De Castro, D. Dowsett, T. Wirtz, and S. Della Negra
Référence
Microscopy and Microanalysis, vol. 21, no. S4, pp. 94-99, 2015
Lien
doi: 10.1017/S1431927615013203
Towards a high-brightness electron impact ion source for nano-applications
O. De Castro, D. Dowsett, T. Wirtz, and S. Della Negra
Microscopy and Microanalysis, vol. 21, no. S4, pp. 94-99, 2015
doi: 10.1017/S1431927615013203
