Deployment of Magnetic Sector Secondary Ion Mass Spectrometry Technology on Focused Ion Beam Instruments: From the Initial Concept Idea to the Analytical Add-On System
Auteurs
De Castro O., Hoang H.Q., Bouton O., Barrahma R., Coulbary C., Wirtz T.
Référence
Microscopy and Microanalysis, vol. 30, n° 2024, pp. 631-632, 2024
